Compositional and Electrical Resistivity Studies on Thermal Evaporation Lead Selenide Thin Films
نویسندگان
چکیده
Lead selenide films are prepared by the vacuum evaporation technique on clean glass substrates held at room temperature in a vacuum 10 torr. The thickness of the film is measured by employing quartz crystal monitor technique. EDAX analysis confirms the composition of constituent in the PbSe thin films. The electrical resistivity measurements as a function of temperature in the range 303 K 483 K, mostly are performed using FourProbe method. At temperature above 423 K, a sudden increase in resistivity is observed. Thermal activation energy is also calculated by varying the thickness of the films and no systematic variation of activation energy is observed.
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